Invitations at conferences :

22. Sputtering soft materials with energetic molecules: From microscopic models to the real world
7th International Symposium on Atomic Level Characterizations, Maui (USA) (December 2009).
http://alc.surf.nuqe.nagoya-u.ac.jp/
21. Theoretical study of molecular impacts on organic surfaces: Effects of projectile size and target structure
19th International Conference on Ion-Surface Interactions (ISI-2009), Zvenigorod (Russia) (August 2009).
http://www.spbstu.ru/isi2009/
20. Kiloelectronvolt molecular impacts on soft materials: From nanocraters to 3D chemical analysis
9th workshop on Cluster Ion Beam Technology, Tokyo (Japan) (March 2009).
19. Molecular analysis of organic layers with fullerene beams: Fundamentals and applications
17th International Conference on Inelastic Ion-Surface Collisions (IISC-17), Porquerolles (France) (September 2008).
http://iisc17.ganil.fr/
18. Fullerene interactions with polymers: from fundamentals to surface analysis
18th International Conference on Ion-Surface Interactions (ISI-2007), Zvenigorod (Russia) (August 2007).
http://www.spbstu.ru/isi2007/
17. On the road to 3 D molecular imaging
16th International Conference on Secondary Ion Mass Spectrometry (SIMS XVI), Kanazawa (Japan) (October 2007).
http://beams.cc.kogakuin.ac.jp/sims/
16. Probing molecular solids and polymers with fullerenes: Computer simulations and chemical surface analysis, A. Delcorte,
44th IUVTSA Workshop: Sputtering and Ion Emission by Cluster Ion Beams, Barony Castle (Scotland, UK) (April 2007).
http://www.npl.co.uk/iuvsta
15. Simulation of Mono- and Polyatomic Projectile Interactions with Molecular and Polymeric Surfaces, A. Delcorte,
8th International Conference Computer Simulation of Radiation Effects in Solids (COSIRES 2006), Richland (USA) (June 2006).
http://cosires2006.pnl.gov/topics.stm
14. Interaction of keV monoatomic and fullerene ions with organic materials: Recent experiments and simulations, A. Delcorte,
5th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'05), Hawaii (USA) (December 2005).
beam03.ph.kagu.tus.ac.jp/alc/
13. Matrix Enhanced SIMS: The alchemist's solution?, A. Delcorte,
15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), Manchester (UK) (September 2005).
www.meeting.co.uk/simsxv
12. Energy dissipation and molecular emission processes induced in organic surfaces by keV projectiles, including C60: Recent theoretical and experimental progress, A. Delcorte,
17th International Conference on Ion-Surface Interactions 2005 (ISI-2005), Zvenigorod (Russia) (August 2005).
www.spbstu.ru/isi2005/eng/frst_en.html
11. Insights into organic molecule emission: recent computer simulations and experiments, A. Delcorte, P. Bertrand, B. J. Garrison
Nano-molecular Analysis for Emerging Technologies, Teddington (UK) (November 2004).
www.npl.co.uk/nanoanalysis/nmaet.html
10. Modeling of low-energy ion interactions with molecular and polymeric samples, A. Delcorte
6th International Symposium on Ionizing Radiation and Polymers, Houffalize (Belgium) (September 2004).
9. Surfaces locally excited by energetic particles: Energy transfer and molecular ejection, A. Delcorte
International workshop on materials under extreme conditions: experimental validation of atomistic modeling, at the European Centre for Atomic and Molecular
Computations (CECAM), Lyon (France) (May 2004).
8. Adhesion improvement for metallized silicone films, A. Delcorte, S. Befahy, C. Poleunis, M. Troosters, P. Bertrand
International Symposium on Adhesion Aspects of Thin Films, Orlando (USA) (December 2003).
7. Molecular Dynamics for Surface Mass Spectrometry, A. Delcorte, P. Bertrand and B. J. Garrison,
International workshop on reactive classical potentials versus hybrid methods: toward chemical complexity, at the European Centre for Atomic and Molecular
Computations (CECAM), Lyon (France) (June 2003).
6. A microscopic view of organic SIMS, A. Delcorte and B. J. Garrison
15th Annual SIMS Workshop, Clearwater (Florida) (April-May 2002). Plenary Session.
5. Fundamentals of fragment ion emission (workshop), A. Delcorte
13th International Conference on Secondary Ion Mass Spectrometry, Nara (Japan) (November 2001).
4. Molecular dynamics in organic SIMS, A. Delcorte
VIèmes Rencontres du Club Jeunes de la Société Française de Spectrométrie de Masse, Les Rives de Thau (France) (March 2001).
3. Fundamental Aspects in SIMS of Complex Molecules, A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison,
11th International Conference on Quantitative Surface Analysis, Guildford (England) (July 2000).
2. How do large organic molecules sputter?  Insights from ToF-SIMS and Molecular Dynamics simulations, A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison
12th International Conference on Secondary Ion Mass Spectrometry, Brussels (Belgium) (September 1999).
1. Secondary molecular ion emission in static SIMS of organic materials, P. Bertrand, A. Delcorte,
11th International Conference on Secondary Ion Mass Spectrometry, Orlando (U.S.A.) (September 1997).
 

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83.  K. Hamraoui, A. Delcorte
Effects of molecular orientation and size in sputtering of model organic crystals
J. Phys. Chem. (BJ Garrison Festschrift), 2009, in press.
82.  N. Wehbe, T. Mouhib, A. Prabhakaran, P. Bertrand, A. Delcorte
[PDF]Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles
J. Am. Soc. Mass Spectrom., 2009, in press.
81.  A. Delcorte, B. J. Garrison, K. Hamraoui
[PDF]Dynamics of molecular impacts on soft materials: From fullerenes to organic nanodrops
Anal. Chem., 2009, 81, 6676-6686.
80.  N. Nieuwjaer, C. Poleunis, A. Delcorte, P. Bertrand
[PDF]Depth profiling of polymer samples using Ga+ and C60+ ion beams
Surf. Interface Anal., 2009, 41, 6-10.
79.  A. Heile, D. Lipinsky, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.J. Pireaux, R. De Mondt, L. Van Vaeck, H. F. Arlinghaus
[PDF]Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Appl. Surf. Sci., 2008, 255, 941-943.
78.  N. Wehbe, A. Heile, H. F. Arlinghaus, P. Bertrand, A. Delcorte
[PDF]Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in static secondary ion mass spectrometry
Anal. Chem., 2008, 80, 6235-6244.
77.  N. Wehbe, A. Delcorte, A. Heile, H. F. Arlinghaus, P. Bertrand
[PDF]Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry
Appl. Surf. Sci., 2008, 824-827.
76.  G. Legent, A. delaune, V. Norris, A. Delcorte, D. Gibouin, F. Lefebvre, G. Misevic, M. Thellier, C. Ripoll,
[PDF]Method for macromolecular colocalization using atomic recombination in dynamic SIMS
J. Phys. Chem. B, 2008, 112, 5534-5546.
75.  R. De Mondt, L. Van Vaeck, A. Heile, H. F. Arlinghaus, N. Nieuwjaer, A. Delcorte, P. Bertrand, J. Lenaerts, F. Vangaever,
[PDF]Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions
Rapid Commun. Mass Spectrom., 2008, 22, 1481-1496.
74.  A. Heile, D. Lipinsky, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.-J. Pireaux, R. De Mondt, P. Van Royen, L. Van Vaeck, H. F. Arlinghaus,
[PDF]Investigation of methods to enhance the secondary ion yields in ToF-SIMS of organic samples
Surf. Interface Anal., 2008, 40, 538-542.
73.  E. Dague, A. Delcorte, J. P. Latgé, Y. F. Dufrêne,
[PDF]Combined use of atomic force microscopy, X-ray photoelectron spectroscopy and secondary ion mass spectrometry for cell surface analysis
Langmuir (letters), 2008, 24, 2955-2959.
72.  A. Delcorte,
[PDF]On the road to high-resolution 3D molecular imaging
Appl. Surf. Sci., 2008, 255, 954-958.
71.  A. Delcorte, N. Wehbe, P. Bertrand, B. J. Garrison,
[PDF]Sputtering of organic molecules by clusters, with focus on fullerenes
Appl. Surf. Sci., 2008, 1229-1234.
70.  S. Yunus, C. de Crombrugghe de Looringhe, C. Poleunis, A. Delcorte,
[PDF]Diffusion of oligomers from polydimethylsiloxane stamps in microcontact printing: Surface analysis and possible application
Surf. Interface Anal. 2007, 39, 922-925.
69.  A. Delcorte, B. J. Garrison
[PDF]Sputtering polymers with buckminsterfullerene projectiles: A coarse-grain molecular dynamics study
J. Phys. Chem. 2007, 111, 15312-15324.
68.  A. Delcorte, S. Yunus, N. Wehbe, N. Nieuwjaer, C. Poleunis, A. Felten, L. Houssiau, J.-J. Pireaux, P. Bertrand
[PDF]Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles
Anal. Chem. 2007, 79, 3673-3689.
67. S. Yunus, A. Delcorte, C. Poleunis, P. Bertrand, A. Bolognesi, C. Botta
[PDF]A new route to self-organized honeycomb micro-structured polystyrene films and their chemical characterization by ToF-SIMS imaging
Adv.Funct.Mater. 2007, 17, 1079 ?1084.
66. A. Delcorte, B. J. Garrison
[PDF]KeV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal
Nucl. Instrum. Meth. Phys. Res. B 2007, 255, 223-228.
65. B. Arezki, A. Delcorte, B. J. Garrison, P. Bertrand
[PDF]Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment
J. Phys. Chem. B 2006, 110, 6832-6840.
64. V. Solomko, M. Verstraete, A. Delcorte, B. J. Garrison, X. Gonze, P. Bertrand
[PDF]Modeling the dissociation and ionization of a sputtered organic molecule
Appl. Surf. Sci. 2006, 252, 6459-6462.
63. A. Delcorte
[PDF]Matrix-Enhanced SIMS: The Alchemist's Solution?
Appl. Surf. Sci. 2006, 252, 6582-6587.
62. B. Czerwinski, A. Delcorte, B. J. Garrison, B. Samson, N. Winograd, Z. Postawa
[PDF]Sputtering of thin benzene and polystyrene overlayers by keV Ga and C60 bombardment
Appl. Surf. Sci. 2006, 252, 6419-6422.
61. A. Delcorte, C. Poleunis, P. Bertrand
[PDF]Energy distributions of atomic and molecular ions sputtered by C60+ projectiles
Appl. Surf. Sci. 2006, 252, 6542-6546.
60. A. Delcorte, C. Poleunis, P. Bertrand
[PDF]Stretching the limits of static SIMS with C60+
Appl. Surf. Sci. 2006, 252, 6494-6497.
59. C. Poleunis, E. P. Everaert, A. Delcorte, P. Bertrand
[PDF]Characterisation of human hair by means of static ToF-SIMS: a comparison between Ga+ and C60+ primary ions
Appl. Surf. Sci. 2006, 252, 6761-6764.
58. C. Poleunis, A. Delcorte, P. Bertrand
[PDF]Determination of the organic contaminations on Si wafer surfaces by static ToF-SIMS: improvement of the detection limit with C60+
Appl. Surf. Sci. 2006, 252, 7258-7261.
57. A. Delcorte
[PDF]Organic surfaces excited by low-energy ions: atomic collisions, molecular desorption and buckminsterfullerenes
Phys. Chem. Chem. Phys. 2005, 7, 3395-3406.
56. A. Delcorte
[PDF]Modeling keV particle interactions with molecular and polymeric samples
Nucl. Instrum. Meth. Phys. Res. B 2005, 236, 1-10.
55. Ch. Willocq, A. Delcorte, S. Hermans, P. Bertrand, M. Devillers
[PDF]Multitechnique investigation of the physisorption and thermal treatment of mixed-metal clusters on carbon
J. Phys. Chem. B 2005, 109, 9482-9489.
54. A. Delcorte, P. Bertrand
[PDF]Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: A critical assessment
Anal. Chem. 2005, 77, 2107-2115.
53. A. Delcorte, B. J. Garrison
[PDF] Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid
J. Phys. Chem. B 2004, 108, 15652-15661.
52. A. Delcorte, S. Befahy, C. Poleunis, M. Troosters, P. Bertrand
[PDF]Improvement of metal adhesion to silicone films: A ToF-SIMS study
Adhesion Aspects of Thin Films, Vol. 2; Ed. K.L. Mittal, © VSP, The Netherlands, 2005. pp. 155-166.
51. A. Delcorte, S. Hermans, M. Devillers, N. Lourette, F. Aubriet, J.-F. Muller, P. Bertrand
[PDF] Desorption/ionization of molecular nanoclusters: SIMS versus MALDI
Appl. Surf. Sci. 2004, 231-232, 131-135.
50. A. Delcorte, P. Bertrand
[PDF]Interest of silver and gold metallization for molecular SIMS and SIMS imaging
Appl. Surf. Sci. 2004, 231-232, 250-255.
49. B. Arezki, A. Delcorte, P. Bertrand
[PDF] Emission processes of molecule-metal cluster ions from self-assembled monolayers of octanethiols on gold and silver
Appl. Surf. Sci. 2004, 231-232, 122-
48. V. Solomko, A. Delcorte, B. J. Garrison, P. Bertrand
[PDF] Sputtering of a polycyclic hydrocarbon molecule: ToF-SIMS experiments and molecular dynamics simulations
Appl. Surf. Sci. 2004, 231-232, 48-53.
47. A. Delcorte, J. Bour, F. Aubriet, J.-F. Muller, P. Bertrand
[PDF] Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: Quantitative evaluation, imaging secondary ion MS and laser ablation
Anal. Chem. 2003, 75, 6875-6885.
46. B. Arezki, A. Delcorte, A. C. Chami, B. J. Garrison, P. Bertrand
[PDF] Gold-thiolate cluster emission from SAMs under keV ion bombardment: Experiments and molecular dynamics simulations
Nucl. Instrum. Meth. Phys. Res. B 2003, 212, 369-
45. A. Delcorte, B. Arezki, B. J. Garrison
[PDF] Matrix and substrate effects on the sputtering of a 2 kDa molecule: Insights from molecular dynamics
Nucl. Instrum. Meth. Phys. Res. B 2003, 212, 414-419.
44. K. D. Krantzman, R. Fenno, A. Delcorte, B. J. Garrison
[PDF] Theoretical simulations of atomic and polyatomic bombardment of an organic overlayer on a metallic substrate
Nucl. Instrum. Meth. Phys. Res. B 2003, 202, 201-205.
43. A. Delcorte, B. J. Garrison
[PDF] Particle-induced desorption of kilodalton molecules embedded in a matrix: a molecular dynamics study
J. Phys. Chem. B 2003, 107, 2297-2310.
42. A. Delcorte, N. Médard, P. Bertrand
[PDF] Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition
Anal. Chem. 2002, 74, 4955-4968.
41. P. Bertrand, A. Delcorte, B. J. Garrison
[PDF] Molecular SIMS for organic layers: new insights
Appl. Surf. Sci. 2003, 203-204, 160-165.
40. I. Wojciechowski, A. Delcorte, X. Gonze, P. Bertrand
[PDF] Mechanism of metal cationization in organic SIMS
Appl. Surf. Sci. 2003, 203-204, 102-105.
39. B. J. Garrison, A. Delcorte, L. V. Zhigilei, T. E. Itina, K. D. Krantzman, Y. G. Yingling, C. M. McQuaw, E. J. Smiley, N. Winograd
[PDF] Big Molecule Ejection - SIMS vs. MALDI
Appl. Surf. Sci. 2003, 203-204, 69-71.
38. A. Delcorte, I. Wojciechowski, X. Gonze, B. J. Garrison, P. Bertrand
[PDF] The formation of singly and doubly cationized oligomers in SIMS
Appl. Surf. Sci. 2003, 203-204, 106-109.
37. A. Delcorte, P. Bertrand, B. J. Garrison
[PDF] A microscopic view of organic sample sputtering
Appl. Surf. Sci. 2003, 203-204, 166-169.
36. B. J. Garrison, A. Delcorte, K. D. Krantzman
[PDF] Modeling sputtering of organic molecules
Izvestiya Akademii Nauk - ser. fizika, 2002, 66, 472-474.
35. A. Delcorte, B. Arezki, P. Bertrand, B. J. Garrison
[PDF] Sputtering kilodalton fragments from polymers
Nucl. Instrum. Meth. Phys. Res. B 2002, 193, 768-774.
34. B. Arezki, A. Delcorte, P. Bertrand
[PDF] Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold
Nucl. Instrum. Meth. Phys. Res. B 2002, 193, 755-
33. A. Delcorte, I. Wojciechowski, X. Gonze, B. J. Garrison, P. Bertrand
[PDF] Single and double cationization of organic molecules in SIMS
Int. J. Mass Spectrom. 2002, 214, 213-232.
32. I. Wojciechowski, A. Delcorte, X. Gonze, P. Bertrand
[PDF] Mechanism of metal cationization in organic SIMS
Chem. Phys. Lett. 2001, 346, 1-8.
31. B. G. Segda, A. Delcorte, P. Bertrand
Application de ToF-SIMS à l'étude des surfaces de polymères: cas du polystyrène, du dibenzanthracène et du triacontane
J. Soc. Ouest-Afr. Chim. 2000, 10, 51-73.
30. A. Delcorte, B. J. Garrison
[PDF] Desorption of large organic molecules induced by keV projectiles
Nucl. Instrum. Meth. Phys. Res. B 2001, 180, 37-43.
29. A. Delcorte, P. Bertrand and B. J. Garrison
[PDF] Collision cascade and sputtering process in a polymer
J. Phys. Chem. B 2001, 105, 9474-9486.
28. A. Delcorte,
Fundamental aspects of organic SIMS in: ToF-SIMS: Surface Analysis by Mass Spectrometry,
Eds.: J. C. Vickerman, D. Briggs, SurfaceSpectra Ltd/IM Publications, Manchester, 2001. pp. 161-194.
27. A. Delcorte, B. J. Garrison,
[PDF] High yield events of molecule emission induced by keV particle bombardment,
J. Phys. Chem. B 2000, 104, 6785-6800.
26. A. Delcorte, B. G. Segda, B. J. Garrison, P. Bertrand,
[PDF] Inferring ejection distances and a surface energy profile in keV particle bombardment experiments ,
Nucl. Instrum. Meth. Phys. Res. B 2000, 171, 277-290.
25. A. Delcorte, X. Vanden Eynde, P. Bertrand, J. C. Vickerman, B. J. Garrison,
[PDF] KeV particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: insights from molecular dynamics,
J. Phys. Chem. B, 2000, 104, 2673-2691.
24. B. J. Garrison, A. Delcorte, K. D. Krantzman,
[PDF] Molecule liftoff from surfaces,
Accts. Chem. Res., 2000, 33, 69-77.
23. B. Arezki, A. Delcorte, P. Bertrand,
Substrate and structural effects on the kinetic energy of molecular fragments in SIMS of polymer overlayers,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 199-202.
22. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
Ion beam patterned polymer surfaces for selective polyelectrolyte multilayer build-up,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 757-760.
21. A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison,
[PDF] How do large organic molecules sputter? Insights from ToF-SIMS and Molecular Dynamics simulations,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 27-32.
20. A. Delcorte, X. Vanden Eynde, P. Bertrand, D. F. Reich,
[PDF] Kinetic Energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) under indium ion bombardment: effects of the primary beam energy and angle,
Nucl. Ins. Meth. Phys. Res. B, 1999, 157, 138-143.
19. A. Delcorte, X. Vanden Eynde, P. Bertrand, D. F. Reich,
Influence of the primary beam parameters (nature, energy and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions,
Int. J. Mass Spectrom. 1999, 189, 133-146.
18. A. Delcorte, P. Bertrand,
Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment,
Int. J. Mass Spectrom. 1999, 184, 217-231.
17. A. Delcorte, P. Bertrand,
[PDF] Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment,
Surface Science 1998, 412/413, 97-124.
16. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 533-536.
15. A. Delcorte, P. Bertrand,
Unimolecular dissociation of metastable secondary ions in SIMS of polymers,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 447-450.
14. P. Bertrand, A. Delcorte,
Secondary molecular ion emission in static SIMS of organic materials,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 437-442.
13. A. Delcorte, P. Bertrand,
[PDF] Influence of chemical structure and beam degradation on the kinetic energy of molecular ions in keV sputtering of polymers,
Nucl. Instr. Meth. B 1998, 135, 430-435.
12. A. Laschewsky, E. Wischerhoff, P. Bertrand and A. Delcorte,
Polyelectrolyte multilayers containing photoreactive groups,
Macromolecular Chemistry & Physics 1997, 198, 3239-3253.
11. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
[PDF]Adsorption of Polyelectrolyte Multilayers on Polymer Surfaces,
Langmuir 1997, 13, 5125-5136.
10. A. Delcorte, B. G. Segda, P. Bertrand,
[PDF]ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission,
Surface Science 1997, 381, 18-32; [PDF]Surface Science 1997, 389, 393-394.
9. P. Hendlinger, A. Laschewsky, P. Bertrand, A. Delcorte, R. Legras, B. Nysten and D. Möbius,
[PDF]Partially fluorinated maleimide copolymers for langmuir films of improved stability. Part 2. Spreading behaviour and multilayer formation,
Langmuir 1997, 13, 310-319.
8. A. Delcorte, P. Bertrand, E. Wischerhoff et A. Laschewsky,
Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS ,
Polymer-Solid Interfaces: from Model to Real Systems, ICPSI 2 proceedings, Eds. J.J. Pireaux, J. delhalle, P. Rudolf, Presses Universitaires de Namur, Namur, 1998. pp.65-76.
7. A. Delcorte, P. Bertrand,
Energy distributions of molecular secondary ions from polymer thin films under keV ion bombardment,
SIMS X proceedings, Eds. A. Benninghoven, B. Hagenhoff and H. W. Werner, J. Wiley & sons publs., Chichester, 1997. pp. 731-734.
6. A. Laschewsky, E. Wischerhoff, S. Denzinger, H. Ringsdorf, P. Bertrand, A. Delcorte,
Molecular recognition by hydrogen bonding in polyelectrolyte multilayers,
Chemistry - A European Journal 1997, 3, 34-38.
5. A. Delcorte, P. Bertrand,
[PDF]Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment : correlation between kinetic and formation energy of the ions sputtered from tricosenoic acid,
Nucl. Instr. Meth. B 1996, 117, 235-242.
4. A. Delcorte, P. Bertrand,
[PDF]Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment,
Nucl. Instr. Meth. B 1996, 115, 246-250.
3. A. Delcorte, P. Bertrand, X. Arys, A. Jonas,
[PDF]ToF-SIMS study of alternate polyelectrolyte thin films : Chemical surface characterization and molecular secondary ions sampling depth,
Surface Science 1996, 366, 149-165.
2. A. Laschewsky, B. Mayer, E. Wischerhoff, X. Arys, A. Jonas, P. Bertrand, A. Delcorte,
A new route to thin polymeric, non-centrosymmetric coatings,
Thin Solid Films 1996, 284/285, 334-337.
1. A. Delcorte, L. T. Weng, P. Bertrand,
[PDF]Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions : effects of the molecular structure and the ion beam induced surface degradation,
Nucl. Instr. Meth. B 1995, 100, 203-216.

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