LIST OF PUBLICATIONS AND COMMUNICATIONS

Invitations at conferences and workshops :

55. SIMS: Understanding the impact 2019
22nd International Conference on Secondary Ion Mass Spectrometry (SIMS XXII), Kyoto (Japan) (October 2019).
http://siss-sims.com/sims22/
54. Organic film analysis, molecular transfer and nanomechanics using large argon cluster beams
24th International Conference on Ion-Surface Interactions (ISI-2019), Moscow (Russia) (August 2019).
https://isi2019.mephi.ru/
53. Large argon clusters: from SIMS to nanomechanics and soft molecular transfer
40th anniversary meeting of the UKSAF, Nottingham (United Kingdom) (July 2019).
https://https://www.uksaf.net/
52. Clusters for organic and hybrid thin film analysis: new challenges and opportunities
WORKSHOP & RÉUNION DES UTILISATEURS FRANCOPHONES ToF-SIMS (ION-TOF), Bordeaux, (France) (March  2019).
51. Collective Action, the Key to Soft Molecule Desorption under Particle Bombardment
AVS 65th International Symposium and Exhibition, Long Beach (USA) (October 2018).
https://www.avs.org/Symposium
50. Large Cluster Ions: From Molecular Analysis of Surfaces to Nanomechanics
7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII）, Suzhou (China) (October 2018).
http://2018sims.csp.escience.cn/dct/page/1
49. Cluster Ion Interactions with Surfaces: From Impact Physics to 3D Molecular Analysis and Nanomechanics
6è Congrès International de la Physique des Interactions Rayonnement-Matière (PIRM-VI’2018), Tangier (Morocco) (May 2018).
http://www.fstt.ac.ma/Portail/actualites/618-6th-congres-international-de-la-physique-des-interactions-rayonnement-matiere-pirm-vi-2018
48. Nanocraters, soft desorption and 3D-resolved organic mass spectrometry using cluster ion beams
1st European Mass Spectrometry Conference (EMSC 2018), Saarbrucken (Germany) (March 2018).
https://emsc2018.sciencesconf.org/
47. SIMS: Understanding the impact
21st International Conference on Secondary Ion Mass Spectrometry (SIMS XXI), Krakow (Poland) (September 2017).
http://sims.confer.uj.edu.pl
46. Large clusters for 3D SIMS imaging:  New physics, new opportunities and... new challenges
79th IUVSTA Workshop: 3D Chemical Imaging – from fundamentals to advancing applications, Sardinia (Italy) (May 2017).
http://www.npl.co.uk/science-technology/surface-and-nanoanalysis/79th-iuvsta-workshop/
45. Nanoscale analysis of organic materials by cluster SIMS: From protein orientation to ultra-shallow molecular depth profiling
7th International Symposium on Practical Surface Analysis (PSA 16), Daejon (Korea) (October 2016).
http://psa16.com/
44. SIMS with large gas clusters: Fundamentals, successes and new challenges
18th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS 18), Tokyo (Japan) (July 2016).
http://siss-sims.com/siss/?page_id=1197
43. Large gas clusters for damageless molecular depth-profiling: Fundamentals, successes and challenges
7ème conférence francophone sur les spectroscopies d'électrons, Paris (France) (May 2016).
http://elspec.org/programme
42. Probing organic surface and thin films with large clusters: From nanocraters to shallow molecular depth profiling
16th European Conference on Applications of Surface and Interface Analysis (ECASIA-2015), Granada (Spain) (September 2015).
http://www.ecasia2015.com/confirmed_keynote.html
41. Fundamentals of soft matter desorption,  molecular analysis and depth-profiling using massive keV clusters
22th International Conference on Ion-Surface Interactions (ISI-2009), Moscow (Russia) (August 2015).
http://isi2015.spbstu.ru/eng/frst_en.html
40.  Fundamentals of surface and thin film molecular analysis by massive projectiles
Nano Molecular Analysis for Emerging Technologies VI, Teddington (UK) (November 2014).
http://conferences.npl.co.uk/nmaet/
39. Fundamentals of soft matter desorption by large Ar clusters
SIMS Europe 2014, Münster (Germany) (September 2014).
http://www.sims-europe.eu/SIMS-Europe/SIMS_Europe_2014.html
38.  (Massive) cluster bombardment of organics: molecular dynamics, sputtering yields, chemistry
26th Annual Workshop on Secondary Ion Mass Spectrometry, National Harbor, Maryland (USA) (May 2014).
http://annualworkshoponsims.wildapricot.org/
37.  Apport des agrégats massifs d’Ar pour l’analyse chimique de films minces organiques
6ème conférence francophone sur les spectroscopies d'électrons, Fès (Morocco) (May 2014).
http://vide.org/elspec2014/
36. Massive clusters for surface analysis: A microscopic view
6th International Symposium on Practical Surface Analysis - PSA-13, Naha city, Okinawa (Japan) (November 2013).
http://www.sasj.jp/PSA/PSA13/
35.  Cluster-induced sputtering: Microscopic models and universal velocity dependences*
* Special session in honor of John C. Vickerman.
19th International Conference on Secondary Ion Mass Spectrometry (SIMS XIX), Jeju (Korea) (September 2013).
http://www.sims19.org/
34. Soft sputtering with supercluster beams: From nanoimpacts to molecular tomography
Particle – surface interactions: from surface analysis to materials processing - PASI 2013, Luxemburg city (Luxemburg) (June 2013).
http://pasi.lippmann.lu/
33. Supercluster beams: From nanocraters to new frontiers in 3D molecular imaging
AnalytiX 2013, 2nd Annual Conference and EXPO , Suzhou (China) (March 2013).
http://www.bitlifesciences.com/analytix2013/
32. High-resolution 3D molecular analysis by cluster ToF-SIMS: The new frontiers
European Materials Research Society 2012 Fall Meeting, Warsaw (Poland) (September 2012).
31. 3D molecular analysis by secondary ion mass spectrometry: New frontiers
Colloque commun de la division de Physique Atomique et Moléculaire et Optique de la SFP et des Journées de Spectroscopie Moléculaire, PAMO-JSM, Metz (France) (July 2012). 
30. Molecular surface analysis by secondary ion mass spectrometry: Going 3D
12ème journée scientifique du GFP section grand Est, Besançon (France) (June 2012).
29. Massive cluster sputtering of organic and nanocomposite materials
14th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS 14), Tokyo (Japan) (June 2012).
28. Kiloelectronvolt cluster bombardment of organic materials:  Experiments and simulations
Joint IAEA-SPIRIT-Japan Technical Meeting on Development and Utilization of MeV-SIMS, Dubrovnik (Croatia) (May 2012). 
27. Surface sputtering with nanoclusters: The relevant parameters
18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII), Riva del Garda (Italy) (September 2011). 
26. Clusters for organic mass spectrometry: From small and hard to huge and soft
Annual Workshop on Secondary Ion Mass Spectrometry, Baltimore, Maryland (USA) (May 2011).
25. ToF-SIMS of organic and bio materials, from static analysis and imaging to 3D molecular analysis
Inaugural ToF-SIMS LEIS Workshop, Imperial College, London (UK) (November 24, 2010).
24. Mechanisms of molecular desorption upon small and massive cluster impacts: Insights from computer simulation
International Conference on Desorption 2010, Seillac (France) (May 2010).
23. Interaction of energetic cluster with organic solids: From molecular dynamics to 3D molecular analysis
4è Congrès International Physique des Interactions Rayonnement-Matière, Dakhla (Morocco) (April 2010).
22. Sputtering soft materials with energetic molecules: From microscopic models to the real world
7th International Symposium on Atomic Level Characterizations, Maui (USA) (December 2009).
21. Theoretical study of molecular impacts on organic surfaces: Effects of projectile size and target structure
19th International Conference on Ion-Surface Interactions (ISI-2009), Zvenigorod (Russia) (August 2009).
20. Kiloelectronvolt molecular impacts on soft materials: From nanocraters to 3D chemical analysis
9th workshop on Cluster Ion Beam Technology, Tokyo (Japan) (March 2009).
19. Molecular analysis of organic layers with fullerene beams: Fundamentals and applications
17th International Conference on Inelastic Ion-Surface Collisions (IISC-17), Porquerolles (France) (September 2008).
18. Fullerene interactions with polymers: from fundamentals to surface analysis
18th International Conference on Ion-Surface Interactions (ISI-2007), Zvenigorod (Russia) (August 2007).
17. On the road to 3 D molecular imaging
16th International Conference on Secondary Ion Mass Spectrometry (SIMS XVI), Kanazawa (Japan) (October 2007).
16. Probing molecular solids and polymers with fullerenes: Computer simulations and chemical surface analysis, A. Delcorte,
44th IUVTSA Workshop: Sputtering and Ion Emission by Cluster Ion Beams, Barony Castle (Scotland, UK) (April 2007).
15. Simulation of Mono- and Polyatomic Projectile Interactions with Molecular and Polymeric Surfaces, A. Delcorte,
8th International Conference Computer Simulation of Radiation Effects in Solids (COSIRES 2006), Richland (USA) (June 2006).
14. Interaction of keV monoatomic and fullerene ions with organic materials: Recent experiments and simulations, A. Delcorte,
5th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'05), Hawaii (USA) (December 2005).
13. Matrix Enhanced SIMS: The alchemist's solution?, A. Delcorte,
15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), Manchester (UK) (September 2005).
12. Energy dissipation and molecular emission processes induced in organic surfaces by keV projectiles, including C60: Recent theoretical and experimental progress, A. Delcorte,
17th International Conference on Ion-Surface Interactions 2005 (ISI-2005), Zvenigorod (Russia) (August 2005).
11. Insights into organic molecule emission: recent computer simulations and experiments, A. Delcorte, P. Bertrand, B. J. Garrison
Nano-molecular Analysis for Emerging Technologies, Teddington (UK) (November 2004).
10. Modeling of low-energy ion interactions with molecular and polymeric samples, A. Delcorte
6th International Symposium on Ionizing Radiation and Polymers, Houffalize (Belgium) (September 2004).
9. Surfaces locally excited by energetic particles: Energy transfer and molecular ejection, A. Delcorte
International workshop on materials under extreme conditions: experimental validation of atomistic modeling, at the European Centre for Atomic and Molecular
Computations (CECAM), Lyon (France) (May 2004).
8. Adhesion improvement for metallized silicone films, A. Delcorte, S. Befahy, C. Poleunis, M. Troosters, P. Bertrand
International Symposium on Adhesion Aspects of Thin Films, Orlando (USA) (December 2003).
7. Molecular Dynamics for Surface Mass Spectrometry, A. Delcorte, P. Bertrand and B. J. Garrison,
International workshop on reactive classical potentials versus hybrid methods: toward chemical complexity, at the European Centre for Atomic and Molecular
Computations (CECAM), Lyon (France) (June 2003).
6. A microscopic view of organic SIMS, A. Delcorte and B. J. Garrison
15th Annual SIMS Workshop, Clearwater (Florida) (April-May 2002). Plenary Session.
5. Fundamentals of fragment ion emission (workshop), A. Delcorte
13th International Conference on Secondary Ion Mass Spectrometry, Nara (Japan) (November 2001).
4. Molecular dynamics in organic SIMS, A. Delcorte
VIèmes Rencontres du Club Jeunes de la Société Française de Spectrométrie de Masse, Les Rives de Thau (France) (March 2001).
3. Fundamental Aspects in SIMS of Complex Molecules, A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison,
11th International Conference on Quantitative Surface Analysis, Guildford (England) (July 2000).
2. How do large organic molecules sputter?  Insights from ToF-SIMS and Molecular Dynamics simulations, A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison
12th International Conference on Secondary Ion Mass Spectrometry, Brussels (Belgium) (September 1999).
1. Secondary molecular ion emission in static SIMS of organic materials, P. Bertrand, A. Delcorte,
11th International Conference on Secondary Ion Mass Spectrometry, Orlando (U.S.A.) (September 1997).

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PhD Thesis :

[PDF]Static Secondary Ion Mass Spectrometry of Thin Organic Layers, Defended on January 6th, 1999.


Publications* :
* All the copyrights are owned by the respective journals. Printing, reproduction and diffusion of these articles fall under the copyright laws.

Book Chapters:

5. A. Delcorte, O.A. Restrepo, B. Czerwinski, Cluster SIMS of organic materials: Theoretical insights
in: Cluster Secondary Ion Mass Spectrometry: Principles and Applications;
Ed. Ch. Mahoney, John Wiley & Sons, Inc., Hoboken, NJ, USA, 2013. pp. 13-55

4. A. Delcorte, Fundamentals of organic SIMS: insights from experiments and models
in: ToF-SIMS: Surface Analysis by Mass Spectrometry, 2nd Edition;
Eds.: J. C. Vickerman, D. Briggs, SurfaceSpectra Ltd/IM Publications, Manchester, 2013. pp. 87-123.
(doi: 10.1255/tofch4)

3. T. Mouhib and A. Delcorte, SIMS for Organic Film Analysis
in: Mass Spectrometry Handbook;
Ed. M. S. Lee, John Wiley & Sons, Inc., Hoboken, NJ, USA, 2012. pp. 961-1015.

2. A. Delcorte, Sputtering and Ionization Basics
in: The Encyclopedia of Mass Spectrometry Vol. 5, Elemental and Isotope Ratio Mass Spectrometry;
Eds. D. Beauchemin and D. Matthews, Elsevier, 2010. pp. 397-411.

1. A. Delcorte, Fundamental aspects of organic SIMS
in: ToF-SIMS: Surface Analysis by Mass Spectrometry;
Eds.: J. C. Vickerman, D. Briggs, SurfaceSpectra Ltd/IM Publications, Manchester, 2001. pp. 161-194.

All scientific publications until 2014:
For the full updated list, please see my page on google scholar.

140. B. Czerwinski, A. Delcorte
Chemistry and sputtering induced by fullerene and argon clusters in carbon-based materials
Surf. Interface Anal. 2014, 46-S1, 11-14.
139. A. Franquet, C. Fleischmann, T. Conard, E. Voroshazi, C. Poleunis, R. Havelund, A. Delcorte, W. Vandervorst
G-SIMS analysis of organic solar cell materials
Surf. Interface Anal. 2014, 46-S1, 96-99.
138. C. Fleischmann, T. Conard, R. Havelund, A. Franquet, C. Poleunis, E. Voroshazi, A. Delcorte, W. Vandervorst
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Surf. Interface Anal. 2014, 46-S1, 54-57.
137. A. Delcorte, O. A. Restrepo, K. Hamraoui, B. Czerwinski
Cluster impacts in organics: microscopic models and universal sputtering curves,
Surf. Interface Anal. 2014, 46-S1, 46-50.
136. V. Cristaudo, C. Poleunis, B. Czerwinski, A. Delcorte,
Ar Cluster Sputtering of Polymers: Effects of Cluster Size and Molecular Weights
Surf. Interface Anal. 2014, 46-S1, 79-82.
135. A. Delcorte, V. Cristaudo, V. Lebec, B. Czerwinski
Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics
International Journal of Mass Spectrometry 2014, 370, 29–38.                           
134. D. Vidick, A. F. Léonard, C. Poleunis,d A. Delcorte, M. Devillers, S. Hermans
Phospine- and ammonium-functionalized ordered mesoporous carbon as supports for cluster-derived nanoparticles
Catalysis today, 2014, 235, 112-126.
133. M. Vermeulen, C. Poleunis, A. Delcorte, P. Bertrand, J. Sanyova,
The use of argon cluster bombardment for the surface preparation of paint cross-sections for analysis by ToF-SIMS
Surf. Interface Anal. 2014, 46, 781-785.
132. A. Delcorte,
Chapter 4. Fundamentals of organic SIMS: insights from experiments and models 
in: ToF-SIMS: Surface Analysis by Mass Spectrometry, 2nd Edition; 
Eds.: J. C. Vickerman, D. Briggs, SurfaceSpectra Ltd/IM Publications, Manchester, 2013. pp. 87-123.
131. A. Delcorte, O.A. Restrepo, B. Czerwinski
Chapter 2. Cluster SIMS of organic materials: Theoretical insights
in: Cluster Secondary Ion Mass Spectrometry: Principles and Applications;
Ed. Ch. Mahoney, John Wiley & Sons, Inc., Hoboken, NJ, USA, 2013. pp. 13-55.
130. A. Delcorte, V. Cristaudo, V. Lebec, B. Czerwinski
Sputtering of polymers by keV clusters: Microscopic views of the molecular dynamics
International Journal of Mass Spectrometry 2014, 370, 29–38.
129. H. M. Mesfin, A. C. Baudouin, S. Hermans, A. Delcorte, I. Huynen, C. Bailly
Frequency selective microwave absorption induced by controlled orientation of graphene-like nanoplatelets in thin polymer films
Applied Physics Letters 2014, 105, 103105.
128. D. Vidick, M. Herlitschke, C. Poleunis,d A. Delcorte, R. P. Hermann,bc M. Devillers, S. Hermans
Comparison of functionalized carbon nanofibers and multi-walled carbon nanotubes as supports for Fe–Co nanoparticles
J. Mater. Chem. A, 2013, 1, 2050-2063.  
127. D. Merche, Th. Dufour, J. Hubert, C. Poleunis, S. Yunus, A. Delcorte, P. Bertrand, François Reniers
Synthesis of Membrane-Electrode Assembly for Fuel Cells by Means of (Sub)-Atmospheric Plasma Processes
Plasma Process. Polym. 2012, 9, 1144–1153.
126. F. Wahoud, J. Guillot, J.N. Audinot, P. Bertrand, A. Delcorte, H.N. Migeon
Dielectric breakdown during Cs+ sputtering of polyvinyl chloride
Appl. Surf. Sci. 2014, in press.
125. V. Lebec, S. Boujday, C. Poleunis, C.-M. Pradier, A. Delcorte
ToF-SIMS Investigation of the Orientation of Adsorbed Antibodies on SAMs Correlated to Biorecognition Tests
J. Phys. Chem. C 2014, in press.
124. N. Wehbe, T. Mouhib, A. Delcorte, P. Bertrand, R. Moellers, E. Niehuis, L. Houssiau
Comparison of cesium, fullerene and large argon clusters for the molecular depth profiling of amino-acid multilayers
Analytical and Bioanalytical Chemistry 2013, 406, 201-211.
123. V. Lebec, J. Landoulsi, S. Boujday, C. Poleunis, C.-M. Pradier, A. Delcorte
Probing the orientation of beta-lactoglobulin on gold surfaces modified by alkyl thiol self-assembled monolayers
J. Phys. Chem. C, 2013, 117, 11569-11577.
122. T. Mouhib, C. Poleunis, N. Wehbe, J. J. Michels, Y. Galagan, L. Houssiau, P. Bertrand and A. Delcorte
Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: Comparative evaluation of three sputtering beams
Analyst, 2013, 138, 6801-6810.
121. J. Hubert, C. Poleunis, A. Delcorte, P. Laha, J. Bossert, A. Ozkan, P. Bertrand, H. Terryn, and F. Reniers
Plasma polymerization of C4Cl6 and C2H2Cl4 at atmospheric pressure
Polymer 2013, 54, 4085-4092.
120. A. Lherbier, S. Roche, O. A. Restrepo, Y.-M. Niquet, A. Delcorte, J.-C. Charlier
Highly defective graphene : A key prototype of two-dimensional Anderson insulators
Nanoresearch 2013, 6, 326-334.
119. O. A. Restrepo, X. Gonze, P. Bertrand, A. Delcorte
Computer simulation of cluster impacts: Effect of the atomic masses of the projectile and target
Phys. Chem. Chem. Phys. 2013, 15, 7621-7627.
118. R. Havelund, A. Licciardello, J. Bailey, N. Tuccitto, D. Sapuppo, I. S. Gilmore, J. S. Sharp, J. L. S. Lee, T. Mouhib and A. Delcorte
Improving Secondary Ion Mass Spectrometry C60n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing
Anal. Chem. 2013, 85, 5064–5070.
117. J. D. DeBord, A. Prabhakaran, M. J. Eller, S. V. Verkhoturov, A. Delcorte, E. A. Schweikert
Metal-assisted SIMS with hypervelocity gold cluster projectiles
International Journal of Mass Spectrometry 2013, 343– 344,  28– 36.
116. A. Delcorte, E. van Hoecke, O.A. Restrepo
Cluster-induced desorption from metal organic surfaces: Structural effects
Nucl. Instrum. Meth. Phys. Res. B 2013, 303, 174–178.  
115. A. Delcorte, B.J. Garrison
Water nanodroplet impacts on surfaces: Effect of the substrate nature
Nucl. Instrum. Meth. Phys. Res. B 2013, 303, 179–183.
114. B. Czerwinski, Z. Postawa, B. Garrison, A. Delcorte
Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment
Nucl. Instrum. Meth. Phys. Res. B 2013, 303,  22–26.
113. B. Czerwinski, A. Delcorte
Molecular dynamics study of fullerite cross-linking under keV C60 and Arn cluster bombardment
J. Phys. Chem. C 2013, 117, 3595-3604.  
112. A. Delcorte, Ch. Leblanc, C. Poleunis, K. Hamraoui
Computer simulations of the sputtering of metallic, organic, and metal-organic surfaces with Bin and C60 projectiles
J. Phys. Chem. C 2013, 117, 2740-2752.
111. C. Poleunis, C. Dupont-Gillain, S. Demoustier-Champagne, A. Delcorte, D. Kalaskar
Characterisation of protein nanotubes by ToF-SIMS imaging
Surf. Interface Anal. 2013, 45, 333-337.
110. N. Wehbe, T. Tabarrant, J. Brison, T. Mouhib, A. Delcorte, P. Bertrand, R. Moellers, E. Niehuis, L. Houssiau
ToF-SIMS depth profiling of multilayer amino-acid films using large argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study
Surf. Interface Anal. 2013, 45, 178-180.
109. T. Mouhib, C. Poleunis,  R. Moellers, E. Niehuis, P. Defrance, P. Bertrand, A. Delcorte
Organic depth profiling of C60 and C60/phtalocyanine layers using argon clusters
Surf. Interface Anal. 2013, 45, 163-166.
108. T. Mouhib, A. Delcorte, C. Poleunis, P. Bertrand
Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection
Surf. Interface Anal. 2013, 45, 46-49.
107. A. Delcorte, O. A. Restrepo, B. Czerwinski, B. J. Garrison
Surface sputtering with nanoclusters: the relevant parameters
Surf. Interface Anal. 2013, 45, 9-13.
106. L. Nittler, A. Delcorte, P. Bertrand, H.-N. Migeon
Insights into the yield enhancement and ion emission process in metal-assisted SIMS
Surf. Interface Anal. 2013, 45, 18-21.
105. L. Nittler, A. Delcorte, P. Bertrand, H.-N. Migeon
Morphology study of small amounts of evaporated gold on polymers
Surf. Interface Anal. 2012, 44, 1072-1075.
104. O. A. Restrepo and A. Delcorte
Argon cluster sputtering of a hybrid metal-organic surface: A microscopic view
J. Phys. Chem. C 2013, DOI: dx.doi.org/10.1021/jp3110503
103. J. Amalric, C. Poleunis, A. Delcorte, J. Marchand-Brynaert
Static SIMS study on surfaces of chalcogenide glasses modified by an organic layer
Surf. Sci. 2012, 606, 1071-1077.
102. T. Mouhib and A. Delcorte
SIMS for Organic Film Analysis, in Mass Spectrometry Handbook (Ed. M. S. Lee),
John Wiley & Sons, Inc., Hoboken, NJ, USA, 2012. pp. 961-1015. (doi: 10.1002/9781118180730.ch42) 
101. A. Prabhakaran, J. Yin, B. Nysten, H. Degand, P. Morsomme, T. Mouhib, S. Yunus, P. Bertrand, A. Delcorte
Metal condensates for low-molecular-weight matrix-free laser desorption/ionization 
Int. J. Mass Spectrom., 2012, 315, 22-30.
100. T. Desmet, C. Poleunis, A. Delcorte, P. Dubruel
Double protein functionalized poly-e-caprolactone surfaces: in depth ToF-SIMS and XPS characterization 
J. Mater. Sci.: Mater. Med., 2012, DOI 10.1007/s10856-011-4527-9. 
99. Ch. Willocq, D. Vidick, B. Tinant, A. Delcorte, P. Bertrand, M. Devillers S. Hermans
Anchoring of Ru–Pt and Ru–Au Clusters onto a Phosphane-Functionalized Carbon Support
Eur. J. Inorg. Chem., 2011, 4721-4729.
98. O. A. Restrepo, A. Delcorte
Au400 sputtering of a polymer with adsorbed nanoparticles: A molecular dynamics study
J. Phys. Chem. C, 2011, 115, 12751–12759.
97. N. Reckinger, C. Poleunis, E. Dubois, C. A. Dutu, X. Tang, A. Delcorte, J.-P. Rasquin
Very low effective Schottky barrier height for ErSi2-x contacts on n-Si through arsenic segregation
Appl. Phys. Lett. 2011, 99, 012110.  
96. O. A. Restrepo, A. Prabhakaran, A. Delcorte
Interaction of energetic clusters (Au3, Au400, C60) with organic material and adsorbed nanoparticles
Nucl. Instrum. Meth. Phys. Res. B, 2011, 269, 1595-1599.
95. A. Delcorte, B. J. Garrison
Desorption of large molecules with light element clusters: Effects of cluster size and substrate nature
Nucl. Instrum. Meth. Phys. Res. B, 2011, 269, 1572-1577.
94. O. A. Restrepo, A. Delcorte
Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles
Surf. Interface Anal., 2011, 43, 70-73.
93. T. Mouhib, A. Delcorte, C. Poleunis, P. Bertrand
C60 molecular depth profiling of bilayered polymer films using ToF-SIMS
Surf. Interface Anal., 2011, 43, 175-178.  
92. L. Nittler, A. Delcorte, P. Bertrand, H.-N. Migeon
Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in Metal-Assisted SIMS
Surf. Interface Anal., 2011, 43, 103-106.
91. A. Prabhakaran, S. Yunus, N. Wehbe, P. Bertrand, A. Delcorte
Secondary Ion Yield Enhancement in organic samples due to Au/Pt nanoparticle condensation and their substrate effects
Surf. Interface Anal., 2011, 43, 74-77.
90. A. Delcorte, B. J. Garrison, K. Hamraoui
Sputtering soft materials with molecular projectiles: A microscopic view
Surf. Interface Anal., 2011, 43, 16-19.
89. F. Wahoud,  T. Mouhib, J.N. Audinot, A. Delcorte, H.N. Migeon
Study of charge effect during Cs+ sputtering of polystyrene in the pre-equilibrium regime
Surf. Interface Anal., 2011, 43, 201-203.
88.  A. Delcorte,
Sputtering and Ionization Basics
The Encyclopedia of Mass Spectrometry Vol. 5, Elemental and Isotope Ratio Mass Spectrometry; Eds. D. Beauchemin and D. Matthews, Elsevier, 2010. pp. 397-411.
87.  T. Mouhib, A. Delcorte, C. Poleunis, P. Bertrand
Organic Secondary Ion Mass Spectrometry: Signal Enhancement by Water Vapor Injection
J. Am. Soc. Mass Spectrom., 2010, doi:10.1016/j.jasms.2010.08.013.
86.  A. Delcorte, P. Bertrand, B. J. Garrison, K. Hamraoui, T. Mouhib, O. A. Restrepo, C.N. Santos, S. Yunus
Probing soft materials with energetic ions and molecules: From microscopic models to the real world
Surf. Interface Anal., 2010, 42, 1380-1386.
85.  O. Restrepo, A. Prabhakaran, K. Hamraoui, N. Wehbe, S. Yunus, P. Bertrand, A. Delcorte
Mechanisms of metal-assisted secondary ion mass spectrometry: a mixed theoretical and experimental study
Surf. Interface Anal., 2010, 42, 6, 1030-1034.
84.  T. Mouhib, A. Delcorte, C. Poleunis, M. Henry, P. Bertrand
C60 SIMS depth profiling of bovine serum albumin (BSA) protein coating films: A conformational study
Surf. Interface Anal., 2010, 42, 641-644.
83.  K. Hamraoui, A. Delcorte
Effects of molecular orientation and size in sputtering of model organic crystals
J. Phys. Chem. C, 2010, 114, 5458–5467.
82.  N. Wehbe, T. Mouhib, A. Prabhakaran, P. Bertrand, A. Delcorte
[PDF]Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles
J. Am. Soc. Mass Spectrom., 2009, 20, 2294-2303.
81.  A. Delcorte, B. J. Garrison, K. Hamraoui
[PDF]Dynamics of molecular impacts on soft materials: From fullerenes to organic nanodrops
Anal. Chem., 2009, 81, 6676-6686.
80.  N. Nieuwjaer, C. Poleunis, A. Delcorte, P. Bertrand
[PDF]Depth profiling of polymer samples using Ga+ and C60+ ion beams
Surf. Interface Anal., 2009, 41, 6-10.
79.  A. Heile, D. Lipinsky, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.J. Pireaux, R. De Mondt, L. Van Vaeck, H. F. Arlinghaus
[PDF]Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Appl. Surf. Sci., 2008, 255, 941-943.
78.  N. Wehbe, A. Heile, H. F. Arlinghaus, P. Bertrand, A. Delcorte
[PDF]Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in static secondary ion mass spectrometry
Anal. Chem., 2008, 80, 6235-6244.
77.  N. Wehbe, A. Delcorte, A. Heile, H. F. Arlinghaus, P. Bertrand
[PDF]Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry
Appl. Surf. Sci., 2008, 824-827.
76.  G. Legent, A. delaune, V. Norris, A. Delcorte, D. Gibouin, F. Lefebvre, G. Misevic, M. Thellier, C. Ripoll,
[PDF]Method for macromolecular colocalization using atomic recombination in dynamic SIMS
J. Phys. Chem. B, 2008, 112, 5534-5546.
75.  R. De Mondt, L. Van Vaeck, A. Heile, H. F. Arlinghaus, N. Nieuwjaer, A. Delcorte, P. Bertrand, J. Lenaerts, F. Vangaever,
[PDF]Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions
Rapid Commun. Mass Spectrom., 2008, 22, 1481-1496.
74.  A. Heile, D. Lipinsky, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.-J. Pireaux, R. De Mondt, P. Van Royen, L. Van Vaeck, H. F. Arlinghaus,
[PDF]Investigation of methods to enhance the secondary ion yields in ToF-SIMS of organic samples
Surf. Interface Anal., 2008, 40, 538-542.
73.  E. Dague, A. Delcorte, J. P. Latgé, Y. F. Dufrêne,
[PDF]Combined use of atomic force microscopy, X-ray photoelectron spectroscopy and secondary ion mass spectrometry for cell surface analysis
Langmuir (letters), 2008, 24, 2955-2959.
72.  A. Delcorte,
[PDF]On the road to high-resolution 3D molecular imaging
Appl. Surf. Sci., 2008, 255, 954-958.
71.  A. Delcorte, N. Wehbe, P. Bertrand, B. J. Garrison,
[PDF]Sputtering of organic molecules by clusters, with focus on fullerenes
Appl. Surf. Sci., 2008, 1229-1234.
70.  S. Yunus, C. de Crombrugghe de Looringhe, C. Poleunis, A. Delcorte,
[PDF]Diffusion of oligomers from polydimethylsiloxane stamps in microcontact printing: Surface analysis and possible application
Surf. Interface Anal. 2007, 39, 922-925.
69.  A. Delcorte, B. J. Garrison
[PDF]Sputtering polymers with buckminsterfullerene projectiles: A coarse-grain molecular dynamics study
J. Phys. Chem. 2007, 111, 15312-15324.
68.  A. Delcorte, S. Yunus, N. Wehbe, N. Nieuwjaer, C. Poleunis, A. Felten, L. Houssiau, J.-J. Pireaux, P. Bertrand
[PDF]Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles
Anal. Chem. 2007, 79, 3673-3689.
67. S. Yunus, A. Delcorte, C. Poleunis, P. Bertrand, A. Bolognesi, C. Botta
[PDF]A new route to self-organized honeycomb micro-structured polystyrene films and their chemical characterization by ToF-SIMS imaging
Adv.Funct.Mater. 2007, 17, 1079 ?1084.
66. A. Delcorte, B. J. Garrison
[PDF]KeV fullerene interaction with hydrocarbon targets: Projectile penetration, damage creation and removal
Nucl. Instrum. Meth. Phys. Res. B 2007, 255, 223-228.
65. B. Arezki, A. Delcorte, B. J. Garrison, P. Bertrand
[PDF]Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment
J. Phys. Chem. B 2006, 110, 6832-6840.
64. V. Solomko, M. Verstraete, A. Delcorte, B. J. Garrison, X. Gonze, P. Bertrand
[PDF]Modeling the dissociation and ionization of a sputtered organic molecule
Appl. Surf. Sci. 2006, 252, 6459-6462.
63. A. Delcorte
[PDF]Matrix-Enhanced SIMS: The Alchemist's Solution?
Appl. Surf. Sci. 2006, 252, 6582-6587.
62. B. Czerwinski, A. Delcorte, B. J. Garrison, B. Samson, N. Winograd, Z. Postawa
[PDF]Sputtering of thin benzene and polystyrene overlayers by keV Ga and C60 bombardment
Appl. Surf. Sci. 2006, 252, 6419-6422.
61. A. Delcorte, C. Poleunis, P. Bertrand
[PDF]Energy distributions of atomic and molecular ions sputtered by C60+ projectiles
Appl. Surf. Sci. 2006, 252, 6542-6546.
60. A. Delcorte, C. Poleunis, P. Bertrand
[PDF]Stretching the limits of static SIMS with C60+
Appl. Surf. Sci. 2006, 252, 6494-6497.
59. C. Poleunis, E. P. Everaert, A. Delcorte, P. Bertrand
[PDF]Characterisation of human hair by means of static ToF-SIMS: a comparison between Ga+ and C60+ primary ions
Appl. Surf. Sci. 2006, 252, 6761-6764.
58. C. Poleunis, A. Delcorte, P. Bertrand
[PDF]Determination of the organic contaminations on Si wafer surfaces by static ToF-SIMS: improvement of the detection limit with C60+
Appl. Surf. Sci. 2006, 252, 7258-7261.
57. A. Delcorte
[PDF]Organic surfaces excited by low-energy ions: atomic collisions, molecular desorption and buckminsterfullerenes
Phys. Chem. Chem. Phys. 2005, 7, 3395-3406.
56. A. Delcorte
[PDF]Modeling keV particle interactions with molecular and polymeric samples
Nucl. Instrum. Meth. Phys. Res. B 2005, 236, 1-10.
55. Ch. Willocq, A. Delcorte, S. Hermans, P. Bertrand, M. Devillers
[PDF]Multitechnique investigation of the physisorption and thermal treatment of mixed-metal clusters on carbon
J. Phys. Chem. B 2005, 109, 9482-9489.
54. A. Delcorte, P. Bertrand
[PDF]Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: A critical assessment
Anal. Chem. 2005, 77, 2107-2115.
53. A. Delcorte, B. J. Garrison
[PDF] Kiloelectronvolt argon-induced molecular desorption from a bulk polystyrene solid
J. Phys. Chem. B 2004, 108, 15652-15661.
52. A. Delcorte, S. Befahy, C. Poleunis, M. Troosters, P. Bertrand
[PDF]Improvement of metal adhesion to silicone films: A ToF-SIMS study
Adhesion Aspects of Thin Films, Vol. 2; Ed. K.L. Mittal, © VSP, The Netherlands, 2005. pp. 155-166.
51. A. Delcorte, S. Hermans, M. Devillers, N. Lourette, F. Aubriet, J.-F. Muller, P. Bertrand
[PDF] Desorption/ionization of molecular nanoclusters: SIMS versus MALDI
Appl. Surf. Sci. 2004, 231-232, 131-135.
50. A. Delcorte, P. Bertrand
[PDF]Interest of silver and gold metallization for molecular SIMS and SIMS imaging
Appl. Surf. Sci. 2004, 231-232, 250-255.
49. B. Arezki, A. Delcorte, P. Bertrand
[PDF] Emission processes of molecule-metal cluster ions from self-assembled monolayers of octanethiols on gold and silver
Appl. Surf. Sci. 2004, 231-232, 122-
48. V. Solomko, A. Delcorte, B. J. Garrison, P. Bertrand
[PDF] Sputtering of a polycyclic hydrocarbon molecule: ToF-SIMS experiments and molecular dynamics simulations
Appl. Surf. Sci. 2004, 231-232, 48-53.
47. A. Delcorte, J. Bour, F. Aubriet, J.-F. Muller, P. Bertrand
[PDF] Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: Quantitative evaluation, imaging secondary ion MS and laser ablation
Anal. Chem. 2003, 75, 6875-6885.
46. B. Arezki, A. Delcorte, A. C. Chami, B. J. Garrison, P. Bertrand
[PDF] Gold-thiolate cluster emission from SAMs under keV ion bombardment: Experiments and molecular dynamics simulations
Nucl. Instrum. Meth. Phys. Res. B 2003, 212, 369-
45. A. Delcorte, B. Arezki, B. J. Garrison
[PDF] Matrix and substrate effects on the sputtering of a 2 kDa molecule: Insights from molecular dynamics
Nucl. Instrum. Meth. Phys. Res. B 2003, 212, 414-419.
44. K. D. Krantzman, R. Fenno, A. Delcorte, B. J. Garrison
[PDF] Theoretical simulations of atomic and polyatomic bombardment of an organic overlayer on a metallic substrate
Nucl. Instrum. Meth. Phys. Res. B 2003, 202, 201-205.
43. A. Delcorte, B. J. Garrison
[PDF] Particle-induced desorption of kilodalton molecules embedded in a matrix: a molecular dynamics study
J. Phys. Chem. B 2003, 107, 2297-2310.
42. A. Delcorte, N. Médard, P. Bertrand
[PDF] Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition
Anal. Chem. 2002, 74, 4955-4968.
41. P. Bertrand, A. Delcorte, B. J. Garrison
[PDF] Molecular SIMS for organic layers: new insights
Appl. Surf. Sci. 2003, 203-204, 160-165.
40. I. Wojciechowski, A. Delcorte, X. Gonze, P. Bertrand
[PDF] Mechanism of metal cationization in organic SIMS
Appl. Surf. Sci. 2003, 203-204, 102-105.
39. B. J. Garrison, A. Delcorte, L. V. Zhigilei, T. E. Itina, K. D. Krantzman, Y. G. Yingling, C. M. McQuaw, E. J. Smiley, N. Winograd
[PDF] Big Molecule Ejection - SIMS vs. MALDI
Appl. Surf. Sci. 2003, 203-204, 69-71.
38. A. Delcorte, I. Wojciechowski, X. Gonze, B. J. Garrison, P. Bertrand
[PDF] The formation of singly and doubly cationized oligomers in SIMS
Appl. Surf. Sci. 2003, 203-204, 106-109.
37. A. Delcorte, P. Bertrand, B. J. Garrison
[PDF] A microscopic view of organic sample sputtering
Appl. Surf. Sci. 2003, 203-204, 166-169.
36. B. J. Garrison, A. Delcorte, K. D. Krantzman
[PDF] Modeling sputtering of organic molecules
Izvestiya Akademii Nauk - ser. fizika, 2002, 66, 472-474.
35. A. Delcorte, B. Arezki, P. Bertrand, B. J. Garrison
[PDF] Sputtering kilodalton fragments from polymers
Nucl. Instrum. Meth. Phys. Res. B 2002, 193, 768-774.
34. B. Arezki, A. Delcorte, P. Bertrand
[PDF] Kinetic energy distributions of molecular and cluster ions sputtered from self-assembled monolayers of octanethiol on gold
Nucl. Instrum. Meth. Phys. Res. B 2002, 193, 755-
33. A. Delcorte, I. Wojciechowski, X. Gonze, B. J. Garrison, P. Bertrand
[PDF] Single and double cationization of organic molecules in SIMS
Int. J. Mass Spectrom. 2002, 214, 213-232.
32. I. Wojciechowski, A. Delcorte, X. Gonze, P. Bertrand
[PDF] Mechanism of metal cationization in organic SIMS
Chem. Phys. Lett. 2001, 346, 1-8.
31. B. G. Segda, A. Delcorte, P. Bertrand
Application de ToF-SIMS à l'étude des surfaces de polymères: cas du polystyrène, du dibenzanthracène et du triacontane
J. Soc. Ouest-Afr. Chim. 2000, 10, 51-73.
30. A. Delcorte, B. J. Garrison
[PDF] Desorption of large organic molecules induced by keV projectiles
Nucl. Instrum. Meth. Phys. Res. B 2001, 180, 37-43.
29. A. Delcorte, P. Bertrand and B. J. Garrison
[PDF] Collision cascade and sputtering process in a polymer
J. Phys. Chem. B 2001, 105, 9474-9486.
28. A. Delcorte,
Fundamental aspects of organic SIMS in: ToF-SIMS: Surface Analysis by Mass Spectrometry,
Eds.: J. C. Vickerman, D. Briggs, SurfaceSpectra Ltd/IM Publications, Manchester, 2001. pp. 161-194.
27. A. Delcorte, B. J. Garrison,
[PDF] High yield events of molecule emission induced by keV particle bombardment,
J. Phys. Chem. B 2000, 104, 6785-6800.
26. A. Delcorte, B. G. Segda, B. J. Garrison, P. Bertrand,
[PDF] Inferring ejection distances and a surface energy profile in keV particle bombardment experiments ,
Nucl. Instrum. Meth. Phys. Res. B 2000, 171, 277-290.
25. A. Delcorte, X. Vanden Eynde, P. Bertrand, J. C. Vickerman, B. J. Garrison,
[PDF] KeV particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: insights from molecular dynamics,
J. Phys. Chem. B, 2000, 104, 2673-2691.
24. B. J. Garrison, A. Delcorte, K. D. Krantzman,
[PDF] Molecule liftoff from surfaces,
Accts. Chem. Res., 2000, 33, 69-77.
23. B. Arezki, A. Delcorte, P. Bertrand,
Substrate and structural effects on the kinetic energy of molecular fragments in SIMS of polymer overlayers,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 199-202.
22. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
Ion beam patterned polymer surfaces for selective polyelectrolyte multilayer build-up,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 757-760.
21. A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison,
[PDF] How do large organic molecules sputter? Insights from ToF-SIMS and Molecular Dynamics simulations,
SIMS XII proceedings; Eds. A. Benninghoven, P. Bertrand, H.-N. Migeon; Elsevier, Amsterdam, 2000. pp. 27-32.
20. A. Delcorte, X. Vanden Eynde, P. Bertrand, D. F. Reich,
[PDF] Kinetic Energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) under indium ion bombardment: effects of the primary beam energy and angle,
Nucl. Ins. Meth. Phys. Res. B, 1999, 157, 138-143.
19. A. Delcorte, X. Vanden Eynde, P. Bertrand, D. F. Reich,
Influence of the primary beam parameters (nature, energy and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions,
Int. J. Mass Spectrom. 1999, 189, 133-146.
18. A. Delcorte, P. Bertrand,
Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment,
Int. J. Mass Spectrom. 1999, 184, 217-231.
17. A. Delcorte, P. Bertrand,
[PDF] Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment,
Surface Science 1998, 412/413, 97-124.
16. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 533-536.
15. A. Delcorte, P. Bertrand,
Unimolecular dissociation of metastable secondary ions in SIMS of polymers,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 447-450.
14. P. Bertrand, A. Delcorte,
Secondary molecular ion emission in static SIMS of organic materials,
SIMS XI proceedings, Eds. R Lareau and G. Gillen, J. Wiley & sons publs., New York, 1998. pp. 437-442.
13. A. Delcorte, P. Bertrand,
[PDF] Influence of chemical structure and beam degradation on the kinetic energy of molecular ions in keV sputtering of polymers,
Nucl. Instr. Meth. B 1998, 135, 430-435.
12. A. Laschewsky, E. Wischerhoff, P. Bertrand and A. Delcorte,
Polyelectrolyte multilayers containing photoreactive groups,
Macromolecular Chemistry & Physics 1997, 198, 3239-3253.
11. A. Delcorte, P. Bertrand, E. Wischerhoff, A. Laschewsky,
[PDF]Adsorption of Polyelectrolyte Multilayers on Polymer Surfaces,
Langmuir 1997, 13, 5125-5136.
10. A. Delcorte, B. G. Segda, P. Bertrand,
[PDF]ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission,
Surface Science 1997, 381, 18-32; [PDF]Surface Science 1997, 389, 393-394.
9. P. Hendlinger, A. Laschewsky, P. Bertrand, A. Delcorte, R. Legras, B. Nysten and D. Möbius,
[PDF]Partially fluorinated maleimide copolymers for langmuir films of improved stability. Part 2. Spreading behaviour and multilayer formation,
Langmuir 1997, 13, 310-319.
8. A. Delcorte, P. Bertrand, E. Wischerhoff et A. Laschewsky,
Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS ,
Polymer-Solid Interfaces: from Model to Real Systems, ICPSI 2 proceedings, Eds. J.J. Pireaux, J. delhalle, P. Rudolf, Presses Universitaires de Namur, Namur, 1998. pp.65-76.
7. A. Delcorte, P. Bertrand,
Energy distributions of molecular secondary ions from polymer thin films under keV ion bombardment,
SIMS X proceedings, Eds. A. Benninghoven, B. Hagenhoff and H. W. Werner, J. Wiley & sons publs., Chichester, 1997. pp. 731-734.
6. A. Laschewsky, E. Wischerhoff, S. Denzinger, H. Ringsdorf, P. Bertrand, A. Delcorte,
Molecular recognition by hydrogen bonding in polyelectrolyte multilayers,
Chemistry - A European Journal 1997, 3, 34-38.
5. A. Delcorte, P. Bertrand,
[PDF]Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment : correlation between kinetic and formation energy of the ions sputtered from tricosenoic acid,
Nucl. Instr. Meth. B 1996, 117, 235-242.
4. A. Delcorte, P. Bertrand,
[PDF]Kinetic energy distributions of secondary molecular ions from thin organic films under ion bombardment,
Nucl. Instr. Meth. B 1996, 115, 246-250.
3. A. Delcorte, P. Bertrand, X. Arys, A. Jonas,
[PDF]ToF-SIMS study of alternate polyelectrolyte thin films : Chemical surface characterization and molecular secondary ions sampling depth,
Surface Science 1996, 366, 149-165.
2. A. Laschewsky, B. Mayer, E. Wischerhoff, X. Arys, A. Jonas, P. Bertrand, A. Delcorte,
A new route to thin polymeric, non-centrosymmetric coatings,
Thin Solid Films 1996, 284/285, 334-337.
1. A. Delcorte, L. T. Weng, P. Bertrand,
[PDF]Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions : effects of the molecular structure and the ion beam induced surface degradation,
Nucl. Instr. Meth. B 1995, 100, 203-216.
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Arnaud Delcorte - August 22, 1997 / Last updated - January 5, 2015