Presently, my group has access to the following SPM equipments:
Dimension Icon (Bruker)
Multimode AFM (FRS-FNRS fundings)
- Modes: C-AFM, LFM, AM-AFM, EFM & KPFM, MFM, CS-AFM, PFT-QNM®, PFM, ...
- Scanners: 100 µm with close-loop control
- Working environments: ambient conditions
- Extensions: electromagnet for in-field analysis up to 1.0 T
Multimode (Bruker):
Multimode AFM (FRS-FNRS fundings)
- Modes: C-AFM, LFM, Force Volume, AM-AFM, EFM, MFM, HarmoniX®, PFT-QNM®
- Scanners: 125 µm, 15 µm
- Working environments: ambient conditions, liquids, high temperature (30 to 200°C)
- Extensions: liquid cell, liquid cell for TM, heating cell
PicoPlus Agilent 5500 (Keysigth)
Multimode STM & AFM (FRS-FNRS fundings):
- Modes: C-AFM, LFM, AM-AFM (acoustic, bottom- and top-MAC modes), EFM & KPFM, MFM, CS-AFM, PFM, STM, STS
- Scanners: 100 µm with close-loop control
- Working environments: ambient conditions, liquids, low & high temperature (-15 to 250°C)
- Extensions: liquid cell, heated sample stage (25°C to 250°C), Peltier stage (-15°C to 35°C), nanolithography, environmental chamber, Resiscope
STM: Scanning Tunnelling Microscopy STS: Scanning Tunnelling Spectroscopy C-AFM: Contact Mode Atomic Force Microscopy LFM: Lateral Force Microscopy (also known as Friction Force Microscopy) AM-AFM: Amplitude-Modulated Atomic Force Microscopy (also known as Tapping® Mode AFM) FM-AFM: Frequency-Modulated Atomic Force Microscopy (also referred as Non-Contact Mode AFM) EFM: Electrostatic Force Microscopy KPFM: Kelvin Probe Force Microscopy PFM: Piezoresponse Force Microscopy CS-AFM: Current-Sensing Atomic Force Microscopy MFM: Magnetic Force Microscopy PFT: Peak-Force Tapping® QNM: Quantitative Nanomechanical Measurements®